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Work Experience
Staff Development Engineer
Qorvo• July 2017 - Present
* Developed a computer vision/pattern recognition system on wafer bin map failure signatures using Convolutional Neural Networks with Keras and TensorFlow. * Developed a CNN system to detect abnormal spikes in PA signal displayed in the frequency domain using the concept of object detection. * Developed an image pattern searching application on wafer bin map based on the Convolution Theorem. * Developed data visualization/analytics tools for product engineering teams.
Education
North Carolina State University, Raleigh
Statistics, MS• January 2016 - May 2019
University of Texas at Dallas, Richardson
Applied Physics, MS• January 2004 - May 2007
Chung Yuan Christian University
Physics, BS• September 1998 - February 2003